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ORCID"Accurate Stacking Effect Macro-Modeling of Leakage Power in Sub-100nm ..."
Shengqi Yang et al. (2005)
- Shengqi Yang, Wayne H. Wolf, Narayanan Vijaykrishnan, Yuan Xie, Wenping Wang:
Accurate Stacking Effect Macro-Modeling of Leakage Power in Sub-100nm Circuits. VLSI Design 2005: 165-170
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