"An asynchronous algorithm for sequential circuit test generation on a ..."

James Sienicki et al. (1995)

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DOI: 10.1109/ICVD.1995.512074

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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James Sienicki, Michael L. Bushnell, Prathima Agrawal, Vishwani D. Agrawal:
An asynchronous algorithm for sequential circuit test generation on a network of workstations. VLSI Design 1995: 36-41

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