"Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive ..."

Priyadharshini Shanmugasundaram, Vishwani D. Agrawal (2012)

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DOI: 10.1109/VLSID.2012.112

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Priyadharshini Shanmugasundaram, Vishwani D. Agrawal:
Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock. VLSI Design 2012: 448-453

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