"Embedded Test for Low Cost Manufacturing."

Janusz Rajski et al. (2004)

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DOI: 10.1109/ICVD.2004.1260896

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer, Thomas Rinderknecht:
Embedded Test for Low Cost Manufacturing. VLSI Design 2004: 21-23

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