"Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults."

Irith Pomeranz et al. (2004)

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DOI: 10.1109/ICVD.2004.1260966

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, M. Enamul Amyeen:
Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults. VLSI Design 2004: 475-480

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