"On Interconnecting Circuits with Multiple Scan Chains for Improved Test ..."

Irith Pomeranz, Sudhakar M. Reddy (2004)

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DOI: 10.1109/ICVD.2004.1261016

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Irith Pomeranz, Sudhakar M. Reddy:
On Interconnecting Circuits with Multiple Scan Chains for Improved Test Data Compression. VLSI Design 2004: 741-744

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