"Impact of Partial Reset on Fault Independent Testing and BIST."

Huy Nguyen, Abhijit Chatterjee, Rabindra K. Roy (1997)

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DOI: 10.1109/ICVD.1997.568202

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Huy Nguyen, Abhijit Chatterjee, Rabindra K. Roy:
Impact of Partial Reset on Fault Independent Testing and BIST. VLSI Design 1997: 537-539

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