"At-speed I/O Test for Fast Vref Optimization in High Speed Single-ended ..."

Sanku Mukherjee et al. (2013)

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DOI: 10.1109/VLSID.2013.204

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sanku Mukherjee, Srinivasaraman Chandrasekaran, Ganapathy Subramanyan E. K., Arul Sendhil:
At-speed I/O Test for Fast Vref Optimization in High Speed Single-ended Memory Systems. VLSI Design 2013: 297-301

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