"Input Pattern Classification for Detection of Stuck-ON and Bridging Faults ..."

Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana (1997)

> Home

Details and statistics

DOI: 10.1109/ICVD.1997.568205

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/vlsid/MenonMJ97
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsid/MenonMJ97
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana:
Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using I_DDQ Testing in BiCMOS and CMOS Circuits. VLSI Design 1997: 545-546

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.