"Path Delay Testing: Variable-Clock Versus Rated-Clock."

Subhashis Majumder, Michael L. Bushnell, Vishwani D. Agrawal (1998)

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DOI: 10.1109/ICVD.1998.646651

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Subhashis Majumder, Michael L. Bushnell, Vishwani D. Agrawal:
Path Delay Testing: Variable-Clock Versus Rated-Clock. VLSI Design 1998: 470-475

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