"Statistical Leakage and Timing Optimization for Submicron Process Variation."

Yuanlin Lu, Vishwani D. Agrawal (2007)

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DOI: 10.1109/VLSID.2007.148

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yuanlin Lu, Vishwani D. Agrawal:
Statistical Leakage and Timing Optimization for Submicron Process Variation. VLSI Design 2007: 439-444

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