"Analysis of Si-body thickness variation for a new 40 nm gate length bFDSOI."

Jyi-Tsong Lin et al. (2007)

> Home

Details and statistics

DOI: 10.1109/VLSID.2007.37

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/vlsid/LinELL07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsid/LinELL07
Jyi-Tsong Lin, Yi-Chuen Eng, Tai-Yi Lee, Kao-Cheng Lin:
Analysis of Si-body thickness variation for a new 40 nm gate length bFDSOI. VLSI Design 2007: 653-656

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.