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"A Sub-0.5V Reliability Aware-Negative Bitline Write-Assisted 8T DP-SRAM ..."
Vinay Kumar et al. (2017)
- Vinay Kumar, Nikhil Puri, Sudhir Kumar, Sumit Srivastav:
A Sub-0.5V Reliability Aware-Negative Bitline Write-Assisted 8T DP-SRAM and WL Strapping Novel Architecture to Counter Dual Patterning Issues in 10nm FinFET. VLSID 2017: 269-274
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