"Parameterized Modeling of Open-Circuit Critical Volume for ..."

M. K. Kidambi et al. (1994)

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DOI: 10.1109/ICVD.1994.282714

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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M. K. Kidambi, Akhilesh Tyagi, Mohammed R. Madani, Magdy A. Bayoumi:
Parameterized Modeling of Open-Circuit Critical Volume for Three-Dimensional Defects in VLSI Processing. VLSI Design 1994: 333-338

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