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ORCID"Parameterized Modeling of Open-Circuit Critical Volume for ..."
M. K. Kidambi et al. (1994)
- M. K. Kidambi, Akhilesh Tyagi, Mohammed R. Madani, Magdy A. Bayoumi:
Parameterized Modeling of Open-Circuit Critical Volume for Three-Dimensional Defects in VLSI Processing. VLSI Design 1994: 333-338
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