"Thermal-Safe Schedule Generation for System-on-Chip Testing."

Rajit Karmakar, Santanu Chattopadhyay (2016)

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DOI: 10.1109/VLSID.2016.47

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Rajit Karmakar, Santanu Chattopadhyay:
Thermal-Safe Schedule Generation for System-on-Chip Testing. VLSID 2016: 475-480

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