"ELURA: A Methodology for Post-Silicon Gate-Level Error Localization Using ..."

Ankit Jindal et al. (2018)

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DOI: 10.1109/VLSID.2018.99

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ankit Jindal, Binod Kumar, Kanad Basu, Masahiro Fujita:
ELURA: A Methodology for Post-Silicon Gate-Level Error Localization Using Regression Analysis. VLSID 2018: 410-415

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