"Evaluation of Non-Quasi-Static Effects during SEU in Deep-Submicron MOS ..."

Palkesh Jain et al. (2006)

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DOI: 10.1109/VLSID.2006.85

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Palkesh Jain, D. Vinay Kumar, J. M. Vasi, Mahesh B. Patil:
Evaluation of Non-Quasi-Static Effects during SEU in Deep-Submicron MOS Devices and Circuits. VLSI Design 2006: 188-193

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