"Efficient Grouping of Fail Chips for Volume Yield Diagnostics."

Lavanya Jagan et al. (2009)

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DOI: 10.1109/VLSI.DESIGN.2009.59

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Lavanya Jagan, Ratan Deep Singh, V. Kamakoti, Ananta K. Majhi:
Efficient Grouping of Fail Chips for Volume Yield Diagnostics. VLSI Design 2009: 97-102

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