"Channel Width Test Data Compression under a Limited Number of Test Inputs ..."

Hideyuki Ichihara et al. (2003)

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DOI: 10.1109/ICVD.2003.1183158

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hideyuki Ichihara, Kozo Kinoshita, Koji Isodono, Shigeki Nishikawa:
Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs. VLSI Design 2003: 329-334

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