"Node-Covering Based Defect and Fault Tolerance Methods for Increased Yield ..."

Fran Hanchek, Shantanu Dutt (1996)

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DOI: 10.1109/ICVD.1996.489489

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Fran Hanchek, Shantanu Dutt:
Node-Covering Based Defect and Fault Tolerance Methods for Increased Yield in FPGAs. VLSI Design 1996: 225-229

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