"A New Definition and a New Class of Sequential Circuits with Combinational ..."

Hideo Fujiwara (2000)

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DOI: 10.1109/ICVD.2000.812623

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hideo Fujiwara:
A New Definition and a New Class of Sequential Circuits with Combinational Test Generation Complexity. VLSI Design 2000: 288-293

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