"New BIST Techniques for Universal and Robust Testing of CMOS Stuck-Open ..."

Debesh Kumar Das, Susanta Chakraborty, Bhargab B. Bhattacharya (1997)

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DOI: 10.1109/ICVD.1997.568094

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Debesh Kumar Das, Susanta Chakraborty, Bhargab B. Bhattacharya:
New BIST Techniques for Universal and Robust Testing of CMOS Stuck-Open Faults. VLSI Design 1997: 303-309

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