"Test Cost Reduction Using Partitioned Grid Random Access Scan."

Dong Hyun Baik, Kewal K. Saluja (2006)

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DOI: 10.1109/VLSID.2006.157

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Dong Hyun Baik, Kewal K. Saluja:
Test Cost Reduction Using Partitioned Grid Random Access Scan. VLSI Design 2006: 169-174

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