"Practical Test and DFT for Next Generation VLSI."

Jacob A. Abraham, Gopi Ganapathy (1996)

> Home

Details and statistics

DOI: 10.1109/VLSID.1996.10011

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  - electronic edition @ ieeecomputersociety.org
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vlsid/AbrahamG96
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsid/AbrahamG96
Jacob A. Abraham, Gopi Ganapathy:
Practical Test and DFT for Next Generation VLSI. VLSI Design 1996: 3

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.