"Dynamic intrinsic chip ID using 32nm high-K/metal gate SOI embedded DRAM."

Daniel Fainstein et al. (2012)

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DOI: 10.1109/VLSIC.2012.6243832

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Daniel Fainstein, Sami Rosenblatt, Alberto Cestero, Norman Robson, Toshiaki Kirihata, Subramanian S. Iyer:
Dynamic intrinsic chip ID using 32nm high-K/metal gate SOI embedded DRAM. VLSIC 2012: 146-147

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