"Optimizing SOC Test Resources Using Dual Sequences."

Wei Zou et al. (2003)

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DOI: 10.1007/0-387-33403-3_12

access: open

type: Conference or Workshop Paper

metadata version: 2018-06-26

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  dblp key:
  - conf/vlsi/ZouCRP03a
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  - https://dblp.org/rec/conf/vlsi/ZouCRP03a
Wei Zou, Chris C. N. Chu, Sudhakar M. Reddy, Irith Pomeranz:
Optimizing SOC Test Resources Using Dual Sequences. VLSI-SoC (Selected Papers) 2003: 181-196

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