"Exploring the use of the finite element method for electromigration ..."

Matthias Thiele, Steve Bigalke, Jens Lienig (2017)

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DOI: 10.1109/VLSI-SOC.2017.8203466

access: closed

type: Conference or Workshop Paper

metadata version: 2017-12-19

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Matthias Thiele, Steve Bigalke, Jens Lienig:
Exploring the use of the finite element method for electromigration analysis in future physical design. VLSI-SoC 2017: 1-6

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