"Enhanced Diagnosis of Failing Bits in Memory Built-in Self-Test."

Ali Shisha, Balajiraja Ravinarayanan, Knut Mellenthin (2024)

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DOI: 10.1109/VLSI-SOC62099.2024.10767835

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-10

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Ali Shisha, Balajiraja Ravinarayanan, Knut Mellenthin:
Enhanced Diagnosis of Failing Bits in Memory Built-in Self-Test. VLSI-SoC 2024: 1-4

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