"Post-silicon failing-test generation through evolutionary computation."

Ernesto Sánchez, Giovanni Squillero, Alberto Paolo Tonda (2011)

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DOI: 10.1109/VLSISOC.2011.6081667

access: closed

type: Conference or Workshop Paper

metadata version: 2017-12-13

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Ernesto Sánchez, Giovanni Squillero, Alberto Paolo Tonda:
Post-silicon failing-test generation through evolutionary computation. VLSI-SoC 2011: 164-167

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