"Worst case analysis for evaluating VLSI circuit performance bounds using ..."

Siwat Saibua, Liuxi Qian, Dian Zhou (2011)

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DOI: 10.1109/VLSISOC.2011.6081660

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Siwat Saibua, Liuxi Qian, Dian Zhou:
Worst case analysis for evaluating VLSI circuit performance bounds using an optimization method. VLSI-SoC 2011: 102-105

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