"An efficient method to localize and correct bugs in high-level designs ..."

Takeshi Matsumoto, Shohei Ono, Masahiro Fujita (2012)

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DOI: 10.1109/VLSI-SOC.2012.6379049

access: closed

type: Conference or Workshop Paper

metadata version: 2022-09-06

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Takeshi Matsumoto, Shohei Ono, Masahiro Fujita:
An efficient method to localize and correct bugs in high-level designs using counterexamples and potential dependence. VLSI-SoC 2012: 291-294

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