"Modeling and Analysis of SRAM PUF Bias Patterns in 14nm and 7nm FinFET ..."

Shayesteh Masoumian et al. (2023)

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DOI: 10.1109/VLSI-SOC57769.2023.10321895

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type: Conference or Workshop Paper

metadata version: 2024-10-06

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Shayesteh Masoumian, Roel Maes, Rui Wang, Karthik Keni Yerriswamy, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil:
Modeling and Analysis of SRAM PUF Bias Patterns in 14nm and 7nm FinFET Technology Nodes. VLSI-SoC 2023: 1-6

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