"Delay Testing Based on Multiple Faulty Behaviors."

Masahiro Fujita (2015)

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DOI: 10.1007/978-3-319-46097-0_5

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Masahiro Fujita:
Delay Testing Based on Multiple Faulty Behaviors. VLSI-SoC (Selected Papers) 2015: 87-108

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