"New Scan-Based Attack Using Only the Test Mode and an Input Corruption ..."

Sk Subidh Ali et al. (2013)

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DOI: 10.1007/978-3-319-23799-2_3

access: open

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Sk Subidh Ali, Samah Mohamed Saeed, Ozgur Sinanoglu, Ramesh Karri:
New Scan-Based Attack Using Only the Test Mode and an Input Corruption Countermeasure. VLSI-SoC (Selected Papers) 2013: 48-68

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