"Test for more than pass/fail using on-chip temperature sensor."

Chih-Wea Wang et al. (2012)

> Home

Details and statistics

DOI: 10.1109/VLSI-DAT.2012.6212639

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vlsi-dat/WangLHWW12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsi-dat/WangLHWW12
Chih-Wea Wang, Chen-Tung Lin, Chun-Chieh Hsu, Ching-Tung Wu, Chi-Feng Wu:
Test for more than pass/fail using on-chip temperature sensor. VLSI-DAT 2012: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.