"Fault-Aware ECC Techniques for Reliability Enhancement of Flash Memory."

Shyue-Kung Lu et al. (2020)

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DOI: 10.1109/VLSI-DAT49148.2020.9196286

access: closed

type: Conference or Workshop Paper

metadata version: 2020-09-29

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Shyue-Kung Lu, Zeng-Long Tsai, Chun-Lung Hsu, Chi-Tien Sun:
Fault-Aware ECC Techniques for Reliability Enhancement of Flash Memory. VLSI-DAT 2020: 1-2

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