"Real-time Error Monitoring System Considering Endurance and Data-retention ..."

Yoshiki Kakuta et al. (2020)

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DOI: 10.1109/VLSI-DAT49148.2020.9196379

access: closed

type: Conference or Workshop Paper

metadata version: 2020-09-29

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Yoshiki Kakuta, Reika Kinoshita, Hiroshi Kinoshita, Chihiro Matsui, Ken Takeuchi:
Real-time Error Monitoring System Considering Endurance and Data-retention Characteristics of TaOX-based ReRAM Storage with Workloads at Data Centers. VLSI-DAT 2020: 1-4

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