"Design-for-diagnosis: Your safety net in catching design errors in known ..."

Sandeep Kumar Goel et al. (2014)

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DOI: 10.1109/VLSI-DAT.2014.6834918

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Sandeep Kumar Goel, Min-Jer Wang, Saman Adham, Ashok Mehta, Frank Lee:
Design-for-diagnosis: Your safety net in catching design errors in known good dies in CoWoS^TM/3D ICs. VLSI-DAT 2014: 1-4

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