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"Parallel order ATPG for test compaction."
Yu-Wei Chen et al. (2018)
- Yu-Wei Chen, Yu-Hao Ho, Chih-Ming Chang, Kai-Chieh Yang, Ming-Ting Li, James Chien-Mo Li:
Parallel order ATPG for test compaction. VLSI-DAT 2018: 1-4
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