"Accurate 3-D capacitance extractions for advanced nanometer CMOS nodes."

Keh-Jeng Chang et al. (2015)

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DOI: 10.1109/VLSI-DAT.2015.7114565

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Keh-Jeng Chang, Shih-Hao Lee, Kuo-Fu Lee, Ping-Hung Yuh, Ho-Che Yu, Wen-Cheng Huang, Victor C. Y. Chang:
Accurate 3-D capacitance extractions for advanced nanometer CMOS nodes. VLSI-DAT 2015: 1-4

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