"V1SCAN: Discovering 1-day Vulnerabilities in Reused C/C++ Open-source ..."

Seunghoon Woo et al. (2023)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2023-10-18

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Seunghoon Woo, Eunjin Choi, Heejo Lee, Hakjoo Oh:
V1SCAN: Discovering 1-day Vulnerabilities in Reused C/C++ Open-source Software Components Using Code Classification Techniques. USENIX Security Symposium 2023: 6541-6556

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