"A Paradigm for Interpreting Metrics and Measuring Error Severity in ..."

Thibault Bañeras Roux et al. (2024)

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DOI: 10.1007/978-3-031-70566-3_16

access: closed

type: Conference or Workshop Paper

metadata version: 2024-09-11

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  dblp key:
  - conf/tsd/RouxRWD24
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Thibault Bañeras Roux, Mickael Rouvier, Jane Wottawa, Richard Dufour:
A Paradigm for Interpreting Metrics and Measuring Error Severity in Automatic Speech Recognition. TSD (2) 2024: 174-183

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