"Decreasing SoC Test Power Dissipation and Test Data Volume Based on ..."

Chunlei Mei, Maoxiang Yi, Zhifei Shen (2011)

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DOI: 10.1109/TRUSTCOM.2011.90

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Chunlei Mei, Maoxiang Yi, Zhifei Shen:
Decreasing SoC Test Power Dissipation and Test Data Volume Based on Pattern Recombination. TrustCom 2011: 701-705

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