"Bias stress induced threshold voltage shift in buckled thin film transistors."

Aswathi R. Nair, Venu Anand, Sanjiv Sambandan (2019)

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DOI: 10.1109/TENCON.2019.8929275

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Aswathi R. Nair, Venu Anand, Sanjiv Sambandan:
Bias stress induced threshold voltage shift in buckled thin film transistors. TENCON 2019: 78-81

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