"IEEE 6th International Conference on Teaching, Assessment, and Learning ..."

> Home

Details and statistics

DOI: —

access: closed

type: Editorship

metadata version: 2021-08-09

- view
  - table of contents in dblp
  - electronic edition @ ieee.org
- export record
  dblp key:
  - conf/tale/2017
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/tale/2017
IEEE 6th International Conference on Teaching, Assessment, and Learning for Engineering, TALE 2017, Hong Kong, December 12-14, 2017. IEEE 2017, ISBN 978-1-5386-0900-2 [contents]

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.