"Randomized polynomial time identity testing for noncommutative circuits."

Vikraman Arvind et al. (2017)

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DOI: 10.1145/3055399.3055442

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Vikraman Arvind, Pushkar S. Joglekar, Partha Mukhopadhyay, S. Raja:
Randomized polynomial time identity testing for noncommutative circuits. STOC 2017: 831-841

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