"Coping with Complexity of Testing Models for Real-Time Embedded Systems."

Ralf Mitsching et al. (2011)

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DOI: 10.1109/SSIRI-C.2011.27

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ralf Mitsching, Carsten Weise, Dominik Franke, Thomas Gerlitz, Stefan Kowalewski:
Coping with Complexity of Testing Models for Real-Time Embedded Systems. SSIRI (Companion) 2011: 128-135

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