"Comparison of Search-Based Algorithms for Stress-Testing Integrated Circuits."

Basil Eljuse, Neil Walkinshaw (2018)

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DOI: 10.1007/978-3-319-99241-9_10

access: open

type: Conference or Workshop Paper

metadata version: 2023-06-26

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  dblp key:
  - conf/ssbse/EljuseW18
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  - https://dblp.org/rec/conf/ssbse/EljuseW18
Basil Eljuse, Neil Walkinshaw:
Comparison of Search-Based Algorithms for Stress-Testing Integrated Circuits. SSBSE 2018: 198-212

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