"Enabling I/O-Efficient Redundancy Transitioning in Erasure-Coded KV Stores ..."

Si Wu, Zhirong Shen, Patrick P. C. Lee (2020)

> Home

Details and statistics

DOI: 10.1109/SRDS51746.2020.00032

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/srds/WuSL20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/srds/WuSL20
Si Wu, Zhirong Shen, Patrick P. C. Lee:
Enabling I/O-Efficient Redundancy Transitioning in Erasure-Coded KV Stores via Elastic Reed-Solomon Codes. SRDS 2020: 246-255

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.