"Stochastic Analysis on RAID Reliability for Solid-State Drives."

Yongkun Li, Patrick P. C. Lee, John C. S. Lui (2013)

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DOI: 10.1109/SRDS.2013.16

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yongkun Li, Patrick P. C. Lee, John C. S. Lui:
Stochastic Analysis on RAID Reliability for Solid-State Drives. SRDS 2013: 71-80

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